- Source: Fluctuation electron microscopy
Fluctuation electron microscopy (FEM), originally called Variable Coherence Microscopy before decoherence effects in the sample rendered that naming moot, is a technique in electron microscopy that probes nanometer-scale or "medium-range" order in disordered materials. The first studies were performed on amorphous Si (Treacy and Gibson 1997) and later on hydrogenated amorphous silicon.
References
Kata Kunci Pencarian:
- Fluctuation electron microscopy
- Amorphous solid
- Transmission electron microscopy
- Scanning transmission electron microscopy
- Electron diffraction
- 4D scanning transmission electron microscopy
- Reflection high-energy electron diffraction
- Super-resolution microscopy
- Paracrystallinity
- Phase-contrast imaging
