- Source: Microscopy and Microanalysis
- Fungsi kerja
- Mikroskop pemindai elektron
- Microscopy and Microanalysis
- Scanning transmission electron microscopy
- Microscopy Society of America
- Electron backscatter diffraction
- Detectors for transmission electron microscopy
- Atom probe
- Scanning electron microscope
- Transmission electron microscopy
- U-Net
- 4D scanning transmission electron microscopy
Microscopy and Microanalysis is a peer-reviewed scientific journal that covers original research in the fields of microscopy, imaging, and compositional analysis, including electron microscopy, fluorescence microscopy, atomic force microscopy, and live-cell imaging. It is published for the Microscopy Society of America.
It was established in February 1995, and was published by Cambridge University Press until Volume 29. All articles published until then first appeared online in The Cambridge Core section known as FirstView. From Volume 29 and onward, the journal was published by the Oxford University Press. According to the Journal Citation Reports, its 2019 impact factor is 3.414.
References
External links
Official website